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Semiconductor Division

Chip & Flash Memory Testing Systems

Dedicated test systems for flash memory chips and SATA SSDs — fast, accurate and portable solutions for incoming quality control and final product validation.

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Flash Memory & SSD Test Systems

As semiconductor storage devices become ubiquitous in consumer electronics, automotive and industrial applications, the need for fast and reliable chip-level testing is critical. Creation Engineerings supplies dedicated test systems for NAND flash memory chips and SATA SSD modules — enabling manufacturers and importers to perform 100% incoming inspection and final QC efficiently.

Portable Flash Memory Test System

Compact, battery-powered test system for NAND flash chip verification — ideal for field use, incoming inspection and goods receipt QC.

NAND Flash NOR Flash eMMC SD Card Portable
  • Supported TypesSLC, MLC, TLC NAND; NOR Flash; eMMC; SD/microSD
  • InterfaceUSB 3.0 to host PC; standalone operation via display
  • Test SpeedUp to 200 MB/s read; 150 MB/s write verification
  • Test FunctionsCapacity verification, bad block scan, read/write/erase cycle test, health check
  • Report OutputPass/Fail with detailed error log; exportable CSV/PDF report
  • PowerUSB powered or internal battery (8-hour operation)
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SATA SSD Test System

High-throughput SATA SSD functional test system with multi-port simultaneous testing capability for production line QC and incoming goods inspection.

SATA III Multi-Port Performance Test S.M.A.R.T. Burn-In
  • InterfaceSATA III (6 Gbps); multi-port: 4 / 8 / 16 DUTs simultaneously
  • Test SpeedSequential read up to 550 MB/s; write up to 500 MB/s per port
  • Test FunctionsSequential R/W, random 4K IOPS, S.M.A.R.T. reading, capacity check, burn-in aging test
  • Capacity Range32 GB to 16 TB per drive
  • Report OutputAutomated pass/fail per DUT; batch reporting with serial number tracking
  • SoftwareWindows-based test management software with barcode scanning integration
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Custom Memory Test Solutions

We can also supply test systems for UFS, PCIe NVMe, CFast and other memory interfaces on request. Contact us with your specific chip type and required test throughput — we'll recommend the right solution.

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